| Обозначение | Заглавие на русском языке | Статус | Язык документа | Цена (с НДС 20%)
в рублях |
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Insulating materials—Test methods for electric strength—Part 1: Test at power frequencies
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Published |
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На языке оригинала
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1613,00
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Insulating materials—Test methods for electric strength—Part 2: Additional requirements for tests using direct voltage
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Published |
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На языке оригинала
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958,00
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Insulating materials—Test methods for electric strength—Part 3: Additional requirements for 1.2/50 μs impulse tests
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Published |
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На языке оригинала
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1058,00
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Recommended methods for the determination of the permittivity and dielectric dissipation factor of electrical insulating materials at power, audio and radio frequencies including meter wavelengths
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Published |
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На языке оригинала
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1814,00
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DryпјЊsolid insulating materials--Resistance test to high-voltageпјЊlow-current arc discharges
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Published |
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На языке оригинала
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1058,00
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The classifications of carbon materials
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Published |
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На языке оригинала
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1411,00
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Sample method of carbon material
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Published |
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На языке оригинала
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1058,00
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Carbon materials-determination of the ash content
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Published |
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На языке оригинала
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958,00
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The test method for compressive strength of carbon materials
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Published |
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На языке оригинала
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958,00
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Edison screw lampholders specially used for explosion-proof liminaires
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Published |
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На языке оригинала
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1210,00
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Gauges for lamp caps and holders - Part 1 : Gauges for screw caps and holders
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Published |
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На языке оригинала
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3578,00
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Gauges for caps and lampholders - Part 2пјљGauges for pin caps and lampholders
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Published |
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На языке оригинала
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7610,00
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Gauges for lamp caps and lampholders - Part 3: Gauges for prefocus caps and lampholders
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Published |
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На языке оригинала
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3276,00
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Gauges for lamp caps and lampholders - Part 4: Gauges for miscellaneous caps and lampholders
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Published |
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На языке оригинала
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4536,00
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Gauges for caps and lampholders - Part 5:Gauges for bayonet caps and lampholders
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Published |
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На языке оригинала
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3377,00
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Test methods for minority carrier lifetime in bulk germanium and silicon by measurement of photoconduetivity decay
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Published |
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На языке оригинала
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1210,00
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Testing method for crystallographic perfection of silicon by preferential etch techniques
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Published |
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На языке оригинала
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1613,00
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Testing methods for determining the orientation of a semiconductor single crystal
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Published |
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На языке оригинала
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1058,00
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Test method for substitutional atomic carbon concent of silicon by infrared absorption
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Published |
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На языке оригинала
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1058,00
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Bleached pulp paper for printed boards
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Published |
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На языке оригинала
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1058,00
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